專利授權


即時同步產生干涉影像之方法及其裝置與解析相位之方法 


專利名稱 即時同步產生干涉影像之方法及其裝置與解析相位之方法
專利國家
   專利證書號
美國 US7,760,363B2
專利權人 國立台北科技大學
發明人 陳亮嘉
應用領域
需求項目









技術摘要


A method and apparatus for simultaneously acquiring interferograms created with a plurality of different interference conditions are provided in the present invention. In the present invention, an object beam and a reference beam are used to interfere with each other and there are a plurality of sub-fields of interference simultaneously generated. All the sub-fields of interference can be simultaneously acquired by an image acquiring device with single shooting action so as to form the plurality of interferograms. Moreover, the present invention also provides a method for solving the phase information of the object beam from the interferograms formed by the foregoing said method.


專利商品特色




聯繫方式


聯絡人:專利技轉組
電 話:(02)2771-2171
地 址:10608 台北市忠孝東路三段1號 行政大樓5樓
與我連絡