可授權專利


面外位移特徵鑑別方法及使用該方法之共振頻率鑑別方法與裝置
 METHOD AND APPARATUS FOR RESONANT FREQUENCY IDENTIFICATION THOUGH OUT-OF-PLANE DISPLACEMENT DETECTION


專利名稱 / Patent Title 面外位移特徵鑑別方法及使用該方法之共振頻率鑑別方法與裝置
METHOD AND APPARATUS FOR RESONANT FREQUENCY IDENTIFICATION THOUGH OUT-OF-PLANE DISPLACEMENT DETECTION
專利國家 / Country
   專利證書號 / Registration Number
美國 / US US 7,782,466 B2
專利權人 / Applicant 國立臺北科技大學 / National Taipei University of Technology
發明人 / Inventor 陳亮嘉/ Liang-Chia Chen, 黃耀庭/ Chung-Chu Chang, 張中柱/ Yao-ting Huang, 陳金亮/ Jin-Liang Chen

專利詳細說明
Patent Details

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技術摘要 / Abstract


A method for out-of-plane displacement detection is disclosed. The out-of-plane displacement is detected by analyzing all the fringe density indexes calculated using the frequency-domain information extracted from a series of interference images of the sample vibrating at different frequencies. The present invention further discloses a method and an apparatus for resonant frequency identification by detecting the peak value of all the fringe indexes calculated at different scanning frequencies. With the identified resonant frequency, the full-field vibratory surface profile of the sample in various resonance modes can be reconstructed.


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